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VTR Head Inspection by using Image Processing Technique
Yoo Young Ki, No Byeong Ok, Oh Choon Suk The Transactions of the Korea Information Processing Society (1994 ~ 2000),
Vol. 5, No. 4, pp. 1074-1082,
Apr.
1998
10.3745/KIPSTE.1998.5.4.1074
10.3745/KIPSTE.1998.5.4.1074
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Vol. 1, 2012
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All publications of KTSDE is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.
KTSDE is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).
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